1. How is PeakView® simulation accuracy verified?
- Accuracy is confirmed in two ways – numerically by validating solver convergence and empirically by correlating with silicon measurements.
2. Are metalfills accounted for during EM simulations?
- Yes. As long as metalfills are available in the layout, they are considered during EM simulations, and PeakView® provides a couple of EM modeling options: ignore metalfills, equivalent dielectric method and bruteforce method, which is the most accurate solution.
3. What types of devices does PeakView® support?
- PeakView® supports any passive devices such as inductors, baluns, transformers, MIM capacitors, MOM capacitors, wires, transmission lines, etc.
4. What technology inputs are required by PeakView®?
- PeakView® has built-in utilities to convert foundry technology files (iRCX and ITF) to a PeakView® profile containing dielectric and metal layer specifications.
5. Can PCircuits™ in PeakView® guarantee DRC correct layout?
- PeakView® provides PCircuits™ that are built using process independent class libraries (coded in python programming language) that account for spacing, width and enclosure rules that are included in the PeakView® profile. PeakView® also models metalfill, slotting and striping correctly to ensure DRC clean designs.
6. What is the numerical method used in PeakView®?
- Method of Moments
7. How long does it take to simulate a device in PeakView®?
- Simulation time is typically 10 times faster that contemporary tools available in the market. The time may vary in accordance with the users’ computational resources available and the scope of the problem being solved. Options are available for parallel processing, iterative solvers and GPU capabilities to speed up the run time. For simple design optimizations, a problem can be solved in a few minutes.
8. Is PeakView® integrated into the design environment?
- Yes. PeakView® can be used directly in the Cadence® and CustomCompiler™ environments.