Typical Foundry Silicon Characterization has their limitations. Uncertainty exists in the de-embedded results and the suitable de-embedding method. Therefore, limited silicon data reference leads to uncertainty in EM design. PeakView®-based Rapid Silicon Characterization approach provides a fast turnaround based on fullwave EM simulations allowing users to de-embed their measurements and verify the reliability of the process technology information.
- De-embedding Simulation and Automation with PeakView®
- PeakView®’s de-embedding study based on EM simulation provides the “as is” simulation capability to electromagnetically simulate the entire de-embedding structures and devices. With the EM simulation data, multiple de-embedding strategies are studied:
- The system error introduced in de-embedding algorithms is quantified.
- Potential flaws can be captured earlier on without silicon cost and time lost.
- Automation of test structure generation can be realized based on PeakView®’s EM design
- PeakView®’s default methods allow the de-embedding of structures based on one, two, or three de-embedding standards, accepting the EM simulation results from structures such as Short, Open, Through and the device-under-test.
- PeakView®’s de-embedding study based on EM simulation provides the “as is” simulation capability to electromagnetically simulate the entire de-embedding structures and devices. With the EM simulation data, multiple de-embedding strategies are studied:

Photonics Transmission Line De-embedding in PeakView®
- Alongside the defauld de-embedding methods, PeakView® includes extensive scripting capabilities allowing the development of new algorithms to satisfy other de-embedding needs.
- Recently, PeakView® launched two methods specifically targeted towards de-embedding transmission lines at high frequencies. These methods take two input standards in a form of two transmission lines with different lengths as described below:
- Cascade square root method: multiport de-embedding method, where two TLines with exact twice the length of each other are used (L2=2L1).
- Cascade arbitrary length method: This method, developed by Lorentz Solution, allows an arbitrary ration between the length of the TLines.
- PeakView de-embedding methods for transmission lines also supports the tapered behavior of the pad connections, delivering a comprehensive silicon characterization solution.

References
- LD16217_PeakView De-embedding Feature
- LD20729 3D Fullwave EM Synthesis Optimization and Sign-off for the New Silicon Photonics Time
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