Silicon Characterization

Typical Foundry Silicon Characterization has their limitations. Uncertainty exists in the de-embedded results and the suitable de-embedding method. Therefore, limited silicon data reference leads to uncertainty in EM design. PeakView®-based Rapid Silicon Characterization approach provides a fast turnaround based on fullwave EM simulations allowing users to de-embed their measurements and verify the reliability of the process technology information.  

  • De-embedding Simulation and Automation with PeakView®
    • PeakView®’s de-embedding study based on EM simulation provides the “as is” simulation capability to electromagnetically simulate the entire de-embedding structures and devices. With the EM simulation data, multiple de-embedding strategies are studied: 
      • The system error introduced in de-embedding algorithms is quantified.
      • Potential flaws can be captured earlier on without silicon cost and time lost. 
      • Automation of test structure generation can be realized based on PeakView®’s EM design
    •  PeakView®’s default methods allow the de-embedding of structures based on one, two, or three de-embedding standards, accepting the EM simulation results from structures such as Short, Open, Through and the device-under-test. 

Photonics Transmission Line De-embedding in PeakView®

    • Alongside the defauld de-embedding methods, PeakView® includes extensive scripting capabilities allowing the development of new algorithms to satisfy other de-embedding needs. 
    • Recently, PeakView® launched two methods specifically targeted towards de-embedding transmission lines at high frequencies. These methods take two input standards in a form of two transmission lines with different lengths as described below: 
        • Cascade square root method: multiport de-embedding method, where two TLines with exact twice the length of each other are used (L2=2L1). 
        • Cascade arbitrary length method: This method, developed by Lorentz Solution, allows an arbitrary ration between the length of the TLines. 
    • PeakView de-embedding methods for transmission lines also supports the tapered behavior of the pad connections, delivering a comprehensive silicon characterization solution. 

References 

    • LD16217_PeakView De-embedding Feature
    • LD20729 3D Fullwave EM Synthesis Optimization and Sign-off for the New Silicon Photonics Time

For Application Notes requests, please contact: support@lorentzsolution.com

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