PeakView™ products are seamlessly integrated into advanced process nodes from mainstream foundries and facilitate different phases of IC design and verification. The state-of-the-art technology simplifies the process of complex system-level EM design, and provides unique sign-off tools bench-marked for physical verification.

PeakView EMD™  EM Synthesis and Analysis – PeakView EMD™ provides parametric EM device synthesis and analysis of sophisticated on-chip passive devices and structures. EMD™ has an extensive synthesis library of parameterized devices that include inductors, transformers, baluns, transmission lines, MIM and MOM capacitors, finger capacitors and other commonly used topologies. In addition to a comprehensive standard library, users have the flexibility to script customized PCircuits tailored to meet their specific design requirements. Designers work with a powerful user interface allowing EMD™ to eliminate the manual steps of drawing devices by hand. EMD™ further automates the design process with options to synthesize target values and sweep design parameters for optimum performance.  (brochure)

PeakView LEM™ – EM Extraction and Modeling – PeakView’s LEM™ extraction solution provides fast, easy to use, single-click EM simulation from within Virtuoso® and Laker™ layout editors. Passive structures and interconnect are automatically extracted for a full wave, 3D electromagnetic analysis. PeakView’s high-capacity engine supports complex multi-port structures and swiftly creates accurate EM models with necessary design library views. (brochure)

PeakView HFD™ – EM Interconnect Design Analysis – PeakView HFD™ is an electromagnetic and parasitic inductance extraction tool for evaluating the electromagnetic behavior of critical signal paths in high-speed designs. At microwave and millimeter wave frequencies, as physical lengths of interconnect approach their wave-lengths, inductive and associated skin loss effects begin to predominate and noticeably impact circuit performance. To address this concern, HFD™ enhances traditional LPE (Layout Parasitic Extraction) capabilities by including electromagnetic effects into LPE generated results. With HFD™, users are able to select critical high frequency signal nets in either the schematic or layout views of their designs. PeakView™ electromagnetically analyzes the corresponding interconnect geometry and reconnects the EM model to the post-layout simulation net-lists output by conventional RC extraction tools. (brochure)

EM Prototyping™ – EM Prototyping Before Layout Completion – Enhance your millimeter wave IC design workflow with PeakView EM Prototyping™.  It analyze circuit-level EM effects like crosstalk and coupling at any stage, even before finalized layout. PeakView automates EM device preparation, modeling, and back-annotation, preserving circuit hierarchy for accurate high-frequency performance analysis. Get fast, precise insights to optimize your designs early and often.. (brochure)

PLX™ – Parasitic Inductance Extraction  – Our new parasitic inductance extraction feature based on Peakview’s 3D Full-wave EM solver which produces silicon matched models across frequencies, with high capacity volume meshing technology to enhance speed, capacity, and accuracy tuned for parasitic inductance extraction.  Net based parasitic inductance values are modeled and annotated to today’s popular DSPF file. (brochure)

PKG/PCB™ – Package and Board-level Analysis – PKG/PCB™ is a utility equipped for IC, package and board-level electromagnetic coupling analysis. The feature expands the application of PeakView LEM™ to include package and PCB signal integrity analysis. This feature provides an efficient solution to address EM design challenges concerning chip-to-board and chip-to-package interactions. (brochure)


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