Silicon Characterization

Silicon Characterization

For RF designs, EM simulations are indispensable design/optimize/signal integrity tools. Silicon data are critical reference data to ensure design closure. Silicon data based modeling tools have thier own uncertainty and limits and can be best quantified and enhanced by EM tools.

Typical foundry Silicon Characterization has their limits too. From test key design, test key manufacturing, measurement to de-embedding, almost all manual work, long cycle, and hard to add new devices for different apps/frequencies. Uncertainty exists in the de-embedded results and de-embedding method. Therefore, customer changing requirements of high-quality silicon data are not met. Limited silicon data reference leads to uncertainty in process data hence the uncertainty in EM design.

Peakview-based Rapid Silicon Characterization approach provides fast turnaround to support customer requirements, including proven flow and automation. High-quality silicon data with quantified error margin of inherent methods are used. Reliable correlation with process information and EM simulations guarantees customer satisfactions.

Why PeakView-based silicon characterization?

Lorentz Solution’s Peakview EM platform has been developed to support the automation of Silicon characterization.   It has such powerful feature as automatic synthesis of DUT (device under test). Typical de-embedding methods are supported, while new de-embedding methods are extended.

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