Events

TSMC Open Innovation Platform Ecosystem Forum (OIP 2014)

September 30, San Jose Convention Center, CA

We are excited to be a part of the TSMC Open Innovation Platform Ecosystem Forum in San Jose, CA. We will provide comprehensive information on how PeakView™ can assist you to achieve the best efficiency for your design goals and meet specifications for microwave, millimeter-wave and THz applications. We will also cover integration of PeakView™ full-wave electromagnetic simulation results into your extraction and SPICE flows. This year, we have been able to achieve radical improvement in the performance of our core EM engine and interconnect parasitic inductance extraction methodology at high frequencies.

Attend Lorentz Solution Presentation in OIP Technical Session

Time: 11:30-12:00
Track: EDA/IP/Service
Description: Rapid Silicon Characterization and Electromagnetic Modeling of Metal Fill and Temperature Effects in 20nm/16nm Processes for RF/High-Speed Analog Design (Lorentz Solution/Altera /TSMC)

PeakView™ is used by leading RF companies and wireless transceiver industries for ultra high-frequency design and verification. Visit our booth at the OIP 2014 and learn more about our RF, MW and MMW solutions.

IEEE Custom Integrated Circuits Conference (CICC)

September 15 – 17, Double Tree Hotel, San Jose, CA

We are looking forward to the Custom Integrated Circuits Conference (CICC) to be held in San Jose this year. We will provide comprehensive information on how PeakView™ can assist you to achieve the best efficiency for your design goals and meet specifications for low-power, high-speed applications. We will also cover integration of PeakView™ full-wave electromagnetic simulation results into your extraction and SPICE flows. This year, we have been able to achieve radical improvement in the performance of our core EM engine. Now design optimization and EM simulation of large structures are faster and more efficient than ever.

PeakView™ is used by leading RF companies and wireless transceiver industries for ultra high-frequency design and verification. You are cordially invited to drop by our booth and learn more about why PeakView™ has emerged as the best quality EM tool for addressing most demanding of design challenges in the IC sector.

 

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